Anisoplanatism within the isoplanatic patch

Anisoplanatism within the isoplanatic patch

著者名:

Christou, J.C. ( Univ. of California/Santa Cruz (USA) )

Steinbring, E.

Faber, S.M.

Gavel, D.T. ( Lawrence Livermore National Lab. (USA) )

Patience, J.

Gates, E.L. ( UCO/Lick Observatory (USA) )

さらに 1 件

掲載資料名:

Adaptive Optical System Technologies II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4839

発行年:

2003

巻:

Part Two

開始ページ:

846

終了ページ:

857

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446183 [0819446181]

言語:

英語

請求記号:

P63600/4839

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012679
シリーズID:	PA00000029
会議名:	Astronomical Telescopes and Instrumentation : Adaptive Optical System Technologies
回次:	2002 : 2nd
会議開催地:	Waikoloa, HI, USA
会議開催年:	2002.08.22-2002.08.26

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