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MIDI scientific and technical observing modes

著者名:
Bakker, E.J. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Leinert, C. ( Max-Planck-Institut fuer Astronomie (Germany) )
Jaffe, W. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Graser, U. ( Max-Planck-Institut fuer Astronomie (Germany) )
Percheron, I. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Chesneau, O. ( Max-Planck-Institut fuer Astronomie (Germany) )
Meisner, J.A. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Cotton, W.D. ( NRAO (USA) )
de Jong, J. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Pel, J.-W. ( ASTRON (Netherlands) )
Glazenborg-Kluttig, A.W. ( ASTRON (Netherlands) )
Perrin, G.S. ( Observatoire de Paris-Meudon (France) )
Przygodda, F. ( Max-Planck-Institut fuer Astronomie (Germany) )
さらに 8 件
掲載資料名:
Interferometry for Optical Astronomy II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4838
発行年:
2003
巻:
Part Two
開始ページ:
905
終了ページ:
916
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446176 [0819446173]
言語:
英語
請求記号:
P63600/4838
資料種別:
国際会議録

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