MIDI scientific and technical observing modes
- 著者名:
Bakker, E.J. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Leinert, C. ( Max-Planck-Institut fuer Astronomie (Germany) ) Jaffe, W. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Graser, U. ( Max-Planck-Institut fuer Astronomie (Germany) ) Percheron, I. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Chesneau, O. ( Max-Planck-Institut fuer Astronomie (Germany) ) Meisner, J.A. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Cotton, W.D. ( NRAO (USA) ) de Jong, J. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Pel, J.-W. ( ASTRON (Netherlands) ) Glazenborg-Kluttig, A.W. ( ASTRON (Netherlands) ) Perrin, G.S. ( Observatoire de Paris-Meudon (France) ) Przygodda, F. ( Max-Planck-Institut fuer Astronomie (Germany) ) - 掲載資料名:
- Interferometry for Optical Astronomy II
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4838
- 発行年:
- 2003
- 巻:
- Part Two
- 開始ページ:
- 905
- 終了ページ:
- 916
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819446176 [0819446173]
- 言語:
- 英語
- 請求記号:
- P63600/4838
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
ESA Publications Division |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
ESA Publications Division |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |