Superresolution technology for small diffraction spot size in the far field

Superresolution technology for small diffraction spot size in the far field

著者名:

Jia, J. ( Shanghai Institute of Optics and Fine Mechanics (China) )
Zhou, C.H.
Xu, W.D.
Xi, P.
Liu, L.R.

掲載資料名:

High-resolution wavefront control : methods, devices and applications IV : 8-9 July 2002, Seattle, Washington, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4825

発行年:

2002

開始ページ:

131

終了ページ:

138

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445933 [0819445932]

言語:

英語

請求記号:

P63600/4825

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012663
シリーズID:	PA00000029
会議名:	Optics & Photonics : High-Resolution Wavefront Control
回次:	2002 : 4th
会議開催地:	Seattle, WA, USA
会議開催年:	2002.07.08-2002.07.09

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