TDAT: a test data analysis tool for near-real-time and batch processing of infrared focal plane data

TDAT: a test data analysis tool for near-real-time and batch processing of infrared focal plane data

著者名:

Nonnast, J.H. ( Mission Research Corp. (USA) )
Tostanoski, M.J.
Goldflam, R.

掲載資料名:

Photonics for space environments VIII : 9-10 July 2002, Seattle, Washington, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4823

発行年:

2002

開始ページ:

151

終了ページ:

154

総ページ数:

4

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445919 [0819445916]

言語:

英語

請求記号:

P63600/4823

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012661
シリーズID:	PA00000029
会議名:	Optics & Photonics : Photonics for Space Environments
回次:	2002 : 8th
会議開催地:	Seattle, WA, USA
会議開催年:	2002.07.09-2002.07.10

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