Measurement of noise in large-area Hg1-xCd xTe photovoltaic detectors: validation/analysis of results

Measurement of noise in large-area Hg1-xCd xTe photovoltaic detectors: validation/analysis of results

著者名:

Smith, D.S. ( ITT Industries, Inc. (USA) )
D'Souza, A.I. ( DRS Sensors & Targeting Systems (USA) )

掲載資料名:

Infrared Technology and Applications XXVIII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4820

発行年:

2003

巻:

Part One

開始ページ:

380

終了ページ:

388

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445889 [0819445886]

言語:

英語

請求記号:

P63600/4820

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012657
シリーズID:	PA00000029
会議名:	Optics & Photonics : Infrared technology and applications
回次:	2002 : 28th
会議開催地:	Seattle, WA, USA
会議開催年:	2002.07.07-2002.07.11

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