Surface morphology of electrochemically etched porous GaP

Surface morphology of electrochemically etched porous GaP

著者名:

Ricci, P.C. ( INFM (Italy) )
Anedda, A. ( Univ. degli Studi di Cagliari (Italy) )
Carbonaro, C.M.
Clemente, F.
Corpino, R.

掲載資料名:

Optical properties of nanocrystals : 9-11 July 2002, Seattle, Washington, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4808

発行年:

2002

開始ページ:

130

終了ページ:

135

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445766 [0819445762]

言語:

英語

請求記号:

P63600/4808

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012645
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optical Properties of Nanocrystals
回次:	2002
会議開催地:	Seattle, WA, USA
会議開催年:	2002.07.09-2002.07.11

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