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Analysis of electron scattering in thin dielectric films used as ion barriers in Generation III image tubes

著者名:
掲載資料名:
Low-light-level and real-time imaging systems, components, and applications :9-11 July 2002, Seattle, Washington, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4796
発行年:
2003
開始ページ:
23
終了ページ:
32
総ページ数:
10
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445636 [0819445630]
言語:
英語
請求記号:
P63600/4796
資料種別:
国際会議録

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