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New metric for 3D optical pattern recognition system

著者名:
Awwal, A.A.S. ( Lawrence Livermore National Lab. (USA) )
Gudmundsson, K.S. ( Wright State Univ. (USA) )
Tabrez, M.
Rahman, M.
Alam, M.S. ( Univ. of South Alabama (USA) )
Iftekharuddin, K.M. ( Univ. of Memphis (USA) )
さらに 1 件
掲載資料名:
Photonic Devices and Algorithms for Computing IV
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4788
発行年:
2002
開始ページ:
183
終了ページ:
190
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445551 [081944555X]
言語:
英語
請求記号:
P63600/4788
資料種別:
国際会議録

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