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Radiation damage test of the x-ray CCDs with low-energy protons

著者名:
Miyata, E. ( Osaka Univ. (Japan) )
Kouno, H. ( Osaka Univ. (Japan) )
Kamazuka, T.
Fukuda, M.
Mihara, M.
Matsuta, K.
Tanaka, K.
Tsunemi, H. ( Osaka Univ. (Japan) )
Minamisono, T. ( Osaka Univ. (Japan) )
Tomida, H. ( National Space Development Agency of Japan (Japan) )
Miyaguchi, K. ( Hamamatsu Photonics K.K. (Japan) )
さらに 6 件
掲載資料名:
X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4784
発行年:
2002
開始ページ:
326
終了ページ:
337
総ページ数:
12
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445513 [0819445517]
言語:
英語
請求記号:
P63600/4784
資料種別:
国際会議録

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