Delayed emission of surface-generated trapped carriers in transient charge transport of single-crystal and policrystalline Hgl2

Delayed emission of surface-generated trapped carriers in transient charge transport of single-crystal and policrystalline Hgl2

著者名:

Zuck, A. ( Hebrew Univ. of Jerusalem (Israel) )
Schieber, M.M. ( Real-Time Radiography (Israel) )
Khakhan, O. ( Real-Time Radiography (Israel) )
Burshtein, Z. ( Ben-Gurion Univ. of the Negev (Israel) )

掲載資料名:

X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4784

発行年:

2002

開始ページ:

279

終了ページ:

287

総ページ数:

9

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445513 [0819445517]

言語:

英語

請求記号:

P63600/4784

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012621
シリーズID:	PA00000029
会議名:	Optics & Photonics : SPIE Conference on Hard X-ray and Gamma-ray Detector Physics ; Conference on X-ray Detectors
回次:	2002 : 4th ; 2002
会議開催地:	Seattle, WA, USA
会議開催年:	2002.07.07-2002.07.09

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