Shack-Hartmann wavefront sensor precision and accuracy
- 著者名:
- Neal, D.R. ( WaveFront Sciences, Inc. (USA) )
- Copland, J.
- Neal, D.A.
- 掲載資料名:
- Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4779
- 発行年:
- 2002
- 開始ページ:
- 148
- 終了ページ:
- 160
- 総ページ数:
- 13
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445469 [0819445460]
- 言語:
- 英語
- 請求記号:
- P63600/4779
- 資料種別:
- 国際会議録
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4
国際会議録
Measurement of lens focal length using multicurvature analysis of Shack-Hartmann wavefront data
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