Realization of aliasing reduction in FTP using microscanning
- 著者名:
- Chen, W.J. ( Sichuan Univ. (China) )
- Su, X.Y.
- Cao, Y.P.
- Xiang, L.Q.
- 掲載資料名:
- Interferometry XI: Applications
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4778
- 発行年:
- 2002
- 開始ページ:
- 150
- 終了ページ:
- 157
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445452 [0819445452]
- 言語:
- 英語
- 請求記号:
- P63600/4778
- 資料種別:
- 国際会議録
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8
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Fourier transform profilometry based on a fringe pattern with two frequency components [6027-54]
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