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Cleanliness validation of NIF small optics

著者名:
Chow, R. ( Lawrence Livermore National Lab. (USA) )
Bickel, R.C.
Ertel, J.
Pryatel, J.
Loomis, G.E.
Stowers, I.F.
Taylor, J.R.
さらに 2 件
掲載資料名:
Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4774
発行年:
2002
開始ページ:
19
終了ページ:
28
総ページ数:
10
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445414 [081944541X]
言語:
英語
請求記号:
P63600/4774
資料種別:
国際会議録

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