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High-resolution measurement of the free spectral range of an etalon

著者名:
掲載資料名:
Electro-optical system design, simulation, testing, and training : 9-10 July 2002, Seattle, Washington, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4772
発行年:
2002
開始ページ:
114
終了ページ:
117
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445391 [0819445398]
言語:
英語
請求記号:
P63600/4772
資料種別:
国際会議録

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