Thermal Stability of HgCdTe Photodiodes
- 著者名:
Pal, R. White, J.K. Antoszwski, J. Musca, C.A. Dell, J.M. Faraone, L. Kumar, V. - 掲載資料名:
- Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001)
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4746
- 発行年:
- 2002
- 巻:
- VOL-1
- 開始ページ:
- 45
- 終了ページ:
- 49
- 総ページ数:
- 5
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445001 [0819445002]
- 言語:
- 英語
- 請求記号:
- P63600/4746
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
SPIE - The International Society of Optical Engineering |
2
国際会議録
RIE-induced n-on-p junction HgCdTe photodiodes: effects of passivant technology on bake stability
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
国際会議録
Laser-beam-induced current technique as a quantitative tool for HgCdTe photodiode characterization
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |