Adaptive sequential Bayesian classification using Page's test

Adaptive sequential Bayesian classification using Page's test

著者名:

Lynch, R.S., Jr. ( Naval Undersea Warfare Ctr. (USA) )
Willett, P.K. ( Univ of Connecticut (USA) )

掲載資料名:

Sensor fusion : architectures, algorithms, and applications VI : 3-5 April 2002, Orlando, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4731

発行年:

2002

開始ページ:

1

終了ページ:

9

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444813 [0819444812]

言語:

英語

請求記号:

P63600/4731

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012566
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Sensor fusion
回次:	2002 : 6th
会議開催地:	Orlando, FL, USA
会議開催年:	2002.04.03-2002.04.05

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