Advanced imaging sensors at Rockwell Scientific Company (Invited Paper)
- 著者名:
Montroy, J.T. ( Rockwell Scientific Co., LLC (USA) ) Garnett, J.D. Cabelli, S.A. Loose, M. Joshi, A.B. Hughes, G.W. Kozlowski, L.J. Haas, A.K. Wong, S.S. Zandian, M. Chen, A.C. Pasko, J.G. Farris, M.C. Cabelli, C.A. Cooper, D.E. Arias, J.M. Bajaj, J. Vural, K. - 掲載資料名:
- Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4721
- 発行年:
- 2002
- 開始ページ:
- 212
- 終了ページ:
- 226
- 総ページ数:
- 15
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444714 [0819444715]
- 言語:
- 英語
- 請求記号:
- P63600/4721
- 資料種別:
- 国際会議録
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SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |