Low-cost microsensors program

Low-cost microsensors program

著者名:

Anderson, J.S. ( Raytheon Co. (USA) )

Kennedy, A. ( Raytheon Infrared Operations (USA) )

Murphy, D.F.

Ray, M.

Wyles, R.

Brown, J.C. ( U.S. Army Night Vision and Electronic Sensors Directorate )

Newsome, G.W.

さらに 6 件

掲載資料名:

Infrared and passive millimeter-wave imaging systems : design, analysis, modeling, and testing : 3-5 April 2002, Orland, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4719

発行年:

2002

開始ページ:

107

終了ページ:

112

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444691 [0819444693]

言語:

英語

請求記号:

P63600/4719

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012554
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Infrared and passive millimeter-wave imaging systems
回次:	2002
会議開催地:	Orlando, FL, USA
会議開催年:	2002.04.03-2002.04.05

類似資料:

1 国際会議録 Low-Cost Microsensors Program Anderson,J.S., Bradley,D., Chin,R., Radford,W.A., Kennedy,A., Murphy,D.F., Ray,M., Wyles,R., Brown,J.C., Newsome,G.W. SPIE - The International Society for Optical Engineering	7 国際会議録 High-sensitivity 25-μm microbolometer FPAs Murphy, D.F., Ray, M., Wyles, R., Asbrock, J.F., Lum, N.A., Wyles,J., Hewitt, C., Kennedy, A., Van Lue, D., Anderson, … SPIE-The International Society for Optical Engineering
2 国際会議録 Low-cost microsensors program Anderson,J.S., Bradley,D., Chen,C.W., Chin,R., Jurgelewicz,K., Radford,W.A., Kennedy,A., Murphy,D.F., Ray,M., Wyles,R., … SPIE-The International Society for Optical Engineering	8 国際会議録 High-sensitivity 25-μm microbolometer FPAs (Invited Paper) Murphy, D.F., Ray, M., Wyles, R., Asbrock, J.F., Lum, N.A,, Wyles, J., Hewitt, C., Kennedy, A., Van Lue, D., Anderson, … SPIE-The International Society for Optical Engineering
3 国際会議録 Advances in uncooled systems applications Anderson, J.S., Bradley, D., Chen, C.W., Chin, R., Gonzalez, H., Hegg, R.G., Kostrzewa, K., Pere, C.L., Ton, S., … SPIE-The International Society for Optical Engineering	9 国際会議録 Performance improvements for VOx microbolometer FPAs Murphy, D.F., Ray, M., Wyles, J., Asbrock, J.F., Hewitt, C., Wyles, R., Gordon, E., Sessler, T., Kennedy, A., Baur, … SPIE - The International Society of Optical Engineering
4 国際会議録 High-sensitivity (25-μm pitch) microbolometer FPAs and application development Murphy,D.F., Ray,M., Wyles,R., Asbrock,J.F., Lum,N.A., Kennedy,A., Wyles,J., Hewitt,C., Graham,G.E., Radford,W.A., … SPIE-The International Society for Optical Engineering	10 国際会議録 High sensitivity 640 x 512 (20 μ pitch) microbolometer FPAs (Invited Paper) [6206-46] Murphy D., Ray M., Kennedy A., Wyles J., Hewitt C., Wyles R., Gordon E., Sessler T., Baur S., Van Lue D., Anderson S., … SPIE - The International Society of Optical Engineering
5 国際会議録 High-sensitivity (25-μm pitch) microbolometer FPAs Murphy,D.F., Ray,M., Wyles,R., Asbrock,J.F., Lum,N.A., Kennedy,A., Wyles,J., Hewitt,C., Graham,G.E., Horikiri,T., … SPIE-The International Society for Optical Engineering	11 国際会議録 Integrated imaging sensors Anderson,J.S., Kostrzewa,T., Cook,L.G., Baker,G., Radford,W.A., Jack,M.D., Finch,A., Kennedy,A., Kojiro,J.K., … SPIE-The International Society for Optical Engineering
6 国際会議録 Resolution and sensitivity improvements for VOx microbolometer FPAs Murphy, D.F., Kennedy, A., Ray, M., Wyles, R., Wyles, J., Asbrock, J.F., Hewitt, C., Lue, D.V., Sessler, T., Anderson, … SPIE-The International Society for Optical Engineering	12 国際会議録 Expanded applications for high performance VOx microbolometer FPAs Murphy, D., Ray, M., Kennedy, A., Wyles, J., Hewitt, C., Wyles, R., Gordon, E., Sessler, T., Baur, S., Van Lue, D., … SPIE - The International Society of Optical Engineering

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