Capacitance sensitivity distributions model and image reconstruction in electrical capacitance tomography

Capacitance sensitivity distributions model and image reconstruction in electrical capacitance tomography

著者名:

Chen, D. ( Harbin Univ. of Science and Technology (China) )
Zheng, G.
Yu, X.

掲載資料名:

Thermosense XXIV : 1-4 April 2002, Orlando, [Florida] USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4710

発行年:

2002

開始ページ:

686

終了ページ:

690

総ページ数:

5

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444608 [081944460X]

言語:

英語

請求記号:

P63600/4710

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012545
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : International Conference on Thermal Sensing and Imaging Diagnostic Applications
回次:	2002
会議開催地:	Orlando, FL, USA
会議開催年:	2002.04.01-2002.04.04

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