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Neural network and statistical modeling techniques for electronic stress prediction

著者名:
Hsieh, S.-J. ( Texas A&M Univ, (USA) )  
掲載資料名:
Thermosense XXIV : 1-4 April 2002, Orlando, [Florida] USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4710
発行年:
2002
開始ページ:
626
終了ページ:
637
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819444608 [081944460X]
言語:
英語
請求記号:
P63600/4710
資料種別:
国際会議録

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