Patterning half-wavelength DRAM cell using chromeless phase lithography (CPL)

Patterning half-wavelength DRAM cell using chromeless phase lithography (CPL)

著者名:

Hsu, C. ( ASML MaskTools, Inc. (USA) )

Chu, R. ( Nanya Technology Corp. (Taiwan) )

Chen, J.F. ( ASML MaskTools, Inc. (USA) )

Van Den Broeke, D.J.

Shi, X.

Hsu, S.D.

Wang, T. ( Nanya Technology Corp. (Taiwan) )

さらに 2 件

掲載資料名:

Optical Microlithography XV

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4691

発行年:

2002

巻:

Part One

開始ページ:

76

終了ページ:

88

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444370 [0819444375]

言語:

英語

請求記号:

P63600/4691

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012525
シリーズID:	PA00000029
会議名:	SPIE Advanced Lithography : Optical microlithography
回次:	2002 : 15th
会議開催地:	Santa Clara, CA, USA
会議開催年:	2002.03.05-2002.03.08

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