Wavelet and statistical analysis for melanoma classification

Wavelet and statistical analysis for melanoma classification

著者名:

Nimunkar, A.J. ( Univ. of Wisconsin/Madison (USA) )
Dhawan, A.P. ( New Jersey Institute of Technology (USA) )
Relue, P.A. ( Univ. of Toledo (USA) )
Patwardhan, S.V. ( New Jersey Institute of Technology (USA) )

掲載資料名:

Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4684

発行年:

2002

巻:

Part Three

開始ページ:

1346

終了ページ:

1353

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819444295 [0819444294]

言語:

英語

請求記号:

P63600/4684

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012515
シリーズID:	PA00000029
会議名:	Medical Imaging
回次:	2002
会議開催地:	San Diego, CA, USA
会議開催年:	2002.02.24-2002.02.28

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