Noise properties of a Se-based flat-panel x-ray detector with CMOS readout integrated circuits
- 著者名:
Adachi, S. ( Shimadzu Corp. (Japan) ) Hirasawa, S. Takahashi, M. ( Sharp Corp. (Japan) ) Okada, H. Yamane, Y. Yamada, S. ( Shimadzu Corp. (Japan) ) - 掲載資料名:
- Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4682
- 発行年:
- 2002
- 開始ページ:
- 580
- 終了ページ:
- 591
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819444271 [0819444278]
- 言語:
- 英語
- 請求記号:
- P63600/4682
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
8
国際会議録
Development of a selenium-based flat-panel detector for real-time radiography and fluoroscopy
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |