Investigation of flourescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm

Investigation of flourescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm

著者名:

Demos, S.G. ( Lawrence Livemore National Lab. (USA) )

Kozlowski, M.R. ( Cierra Photonics (USA) )

Sheehan, L.M. ( Therma-Wave, Inc. (USA) )

Battersby, C.L. ( Terabeam (USA) )

Burnham, A.K. ( Lawrence Livemore National Lab. (USA) )

さらに 4 件

掲載資料名:

Laser-Induced Damage in Optical Materials: 2001

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4679

発行年:

2002

開始ページ:

347

終了ページ:

359

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444189 [0819444189]

言語:

英語

請求記号:

P63600/4679

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012508
シリーズID:	PA00000029
会議名:	Laser Damege : Laser-Induced Damage in Optical Materials
回次:	2001
会議開催地:	Boulder, CO, USA
会議開催年:	2001.10.01-2001.10.02

類似資料:

1 国際会議録 Luminescence investigation of Si02 Surfaces damaged by 0.35-nm laser illumination Kozlowski,M.R., Battersby,C.L., Demos,S.G. SPIE - The International Society for Optical Engineering	7 国際会議録 Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals Carr, C.W., Radousky, H.B., Staggs, M.C., Rubenchik, A.M., Feit, M.D., Demos, S.G. SPIE-The International Society for Optical Engineering
2 国際会議録 Performance of bare and sol-gel-coated DKDP crystal surfaces exposed to mulitiple 351-nm laser pulses in vacuum and air Whitman, P.K., Norton, M.A., Nostrand, M.C., Molander, W.A., Nelson, A., Engelhard, M., Gaspar, D., Baer, D., Siekhaus, … SPIE-The International Society for Optical Engineering	8 国際会議録 Automated damage test facilities for materials development and production optic quality assurance at Lawrence Livermore National Laboratory Sheehan,L.M., Schwartz,S., Battersby,C.L., Dickson,R., Jennings,R.T., Kimmons,J., Kozlowski,M.R., Maricle,S.M., … SPIE - The International Society for Optical Engineering
3 国際会議録 Mechanisms to explain damage growth in optical materials Demos,S.G., Kozlowski,M.R., Staggs,M.C., Chase,L.L., Burnham,A.K., Radousky,H.B. SPIE-The International Society for Optical Engineering	9 国際会議録 Performance of thin borosilicate glass sheets at 351 nm Whitman, P.K., Staggs, M.C., Carr, C.W., Dixit, S.N., Sell, W.D., Milam, D. SPIE-The International Society for Optical Engineering
4 国際会議録 Effects of wet etch processing on laser-induced damage of fused silica surfaces Battersby,C.L., Sheehan,L.M., Kozlowski,M.R. SPIE - The International Society for Optical Engineering	10 国際会議録 Laser-induced material modification in bulk KDP crystals Demos,S.G., Radousky,H.B., Staggs,M.C., Runkel,M., Burnham,A.K. SPIE - The International Society for Optical Engineering
5 国際会議録 Evolution of bulk damage initation in DKDP Carr, C.W., McMilliam, T.H., Staggs, M.C., Radousky, H.B., Demos, S.G. SPIE-The International Society for Optical Engineering	11 国際会議録 Spectroscopic investigation of SiO2 surfaces of optical materials for high-power lasers Demos,S.G., Sheehan,L.M., Kozlowski,M.R. SPIE - The International Society for Optical Engineering
6 国際会議録 Identification and elimination of fluorescent surface-damage precursors on DKDP optics Nostrand, M.C., Thompson, S.L., Siekhaus, W.J., Fluss, M.J., Hahn, D.E., Whitman, P.K., Burnham, A.K. SPIE-The International Society for Optical Engineering	12 国際会議録 Chemical etch effects on laser-induced surface damage growth in fused silica Hrubesh,L.W., Norton,M.A., Molander,W.A., Wegner,P.J., Staggs,M.C., Demos,S.G., Britten,J.A., Summers,L.J., … SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12