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Engineered defects for investigation of laser-induced damage of fused silica at 355 nm

著者名:
Hamza, A.V. ( Lawrence Livemore National Lab. (USA) )
Siekhaus, W.J.
Rubenchik, A.M.
Feit, M.D.
Chase, L.L.
Savina, M. ( Argonne National Lab. (USA) )
Pellin, M.J.
Hutcheon, I.D. ( Lawrence Livemore National Lab. (USA) )
Nostrand, M.C.
Runkel, M.
Choi, B.W.
Staggs, M.C.
Fluss, M.J.
さらに 8 件
掲載資料名:
Laser-Induced Damage in Optical Materials: 2001
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4679
発行年:
2002
開始ページ:
96
終了ページ:
107
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819444189 [0819444189]
言語:
英語
請求記号:
P63600/4679
資料種別:
国際会議録

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