Oxide VCSEL reliability qualification at Agilent Technologies
- 著者名:
- Herrick, R.W. ( Agilent Technologies (USA) )
- 掲載資料名:
- Vertical-Cavity Surface-Emitting Lasers VI
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4649
- 発行年:
- 2002
- 開始ページ:
- 130
- 終了ページ:
- 141
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819443885 [0819443883]
- 言語:
- 英語
- 請求記号:
- P63600/4649
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
国際会議録
Design for Reliability and Common Failure Mechanisms in Vertical Cavity Surface Emitting Lasers
Materials Research Society |
SPIE - The International Society for Optical Engineering |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |