Failure mode analysis of high-power laser diodes (Invited paper)

Failure mode analysis of high-power laser diodes (Invited paper)

著者名:

Ahrens, R..G. ( Lucent Technologies/Bell Labs. (USA) )

Jaques, J.J.

Dutta, N.K. ( Univ. of Connecticut (USA) )

LuValle, M.J. ( OFS Fitel (USA) )

Piccirilli, A.B. ( Lucent Technologies/Bell Labs. (USA) )

掲載資料名:

Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4648

発行年:

2002

開始ページ:

30

終了ページ:

42

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443878 [0819443875]

言語:

英語

請求記号:

P63600/4648

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012476
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Test and measurement applications of optoelectronic devices
回次:	2002
会議開催地:	San Jose, CA, USA
会議開催年:	2002.01.21-2002.01.22

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