Demonstration of high spatial resolution in ultrafast scanning tunneling microscopy (Invited Paper)

Demonstration of high spatial resolution in ultrafast scanning tunneling microscopy (Invited Paper)

著者名:

Yarotski, D.A. ( Los Alamos National Lab.(USA) )
Donati, G.P.
Taylor, A.J.

掲載資料名:

Ultrafast phenomena in semiconductors VI : 21, 24-25 January, 2002, San Jose, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4643

発行年:

2002

開始ページ:

187

終了ページ:

198

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443823 [0819443824]

言語:

英語

請求記号:

P63600/4643

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012471
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Ultrafast phenomena in semiconductors
回次:	2002 : 6th
会議開催地:	San Jose, CA, USA
会議開催年:	2002.01.21, 2002.01.24-2002.01.25

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