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Laser-based sample preparation for electronic package failure analysis

著者名:
Frazier, B.M. ( Potomac Photonics, Inc(USA) )
Mathews, S.A.
Duignan, M.T.
Skoglund, L.D. ( Intel Corp. (USA) )
Wang, Z.
Dias, R.C.
さらに 1 件
掲載資料名:
Photon Processing in Microelectronics and Photonics
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4637
発行年:
2002
開始ページ:
374
終了ページ:
377
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443762 [081944376X]
言語:
英語
請求記号:
P63600/4637
資料種別:
国際会議録

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