Computer simulation of line profile and data processing in diffraction experiments]225

Computer simulation of line profile and data processing in diffraction experiments]225

著者名:

Gurova, T. ( Univ. Federal do Rio de Janeiro(Brazil) )
Teodosio, J.R.
Assis, J.T. ( Univ. do Estado do Rie de Janeiro(Brazil) )
Monin, V.I.
Titovets, Y.F. ( St. Petersburg State Technical Univ. (Russia) )

掲載資料名:

Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4627

発行年:

2002

開始ページ:

225

終了ページ:

229

総ページ数:

5

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443663 [0819443662]

言語:

英語

請求記号:

P63600/4627

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012455
シリーズID:	PA00000029
会議名:	International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
回次:	2001 : 5th
会議開催地:	St. Petersburg, Russia
会議開催年:	2001.06.12-2001.06.17

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