High-resolution spectral self-interference fluorescence microscopy

High-resolution spectral self-interference fluorescence microscopy

著者名:

Swan, A.K. ( Boston Univ. (USA) )

Moiseev, L.

Tong, Y.

Lipoff, S.H. ( Boston Univ. Acadermy (USA) )

Karl, W. C. ( Boston Univ. (USA) )

Goldberg, B.B.

UEnlue, M.S.

さらに 2 件

掲載資料名:

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing IX

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4621

発行年:

2002

開始ページ:

77

終了ページ:

85

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819443601 [0819443603]

言語:

英語

請求記号:

P63600/4621

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012449
シリーズID:	PA00000029
会議名:	SPIE BiOS : Three-Dimensional and Multidimensional Microscopy
回次:	2002 : 9th
会議開催地:	San Jose, CA, USA
会議開催年:	2002.01.22-2002.01.23

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