Blank Cover Image

Effect of window function on noise power spectrum measurements in digital x-ray imaging

著者名:
  • Jiang, H. ( Univ. of Oklahoma(USA) )
  • Chen, W.R. ( Univ. of Central Oklahoma(USA) )
  • Liu, H. ( Univ. of Oklahoma(USA) )
掲載資料名:
Biomedical diagnostic, guidance, and surgical-assist systems IV : 20-21 January 2002, San Jose, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4615
発行年:
2002
開始ページ:
91
終了ページ:
97
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819443540 [0819443549]
言語:
英語
請求記号:
P63600/4615
資料種別:
国際会議録

類似資料:

Wang, Q., Wu, X., Chen, W.R., Cheung, J., Liu, H.

SPIE - The International Society of Optical Engineering

Liu,Y., Liu,W., Zhang,B., Wang,X., Jiang,J.

SPIE-The International Society for Optical Engineering

Jiang,H., Liu,H., Chen,W.R.

SPIE - The International Society for Optical Engineering

Chen, W.R., Liu, H., Nordquist, R.E.

SPIE-The International Society for Optical Engineering

Zhang, Y., Li, S.-X., Chen, W.-F., Jiang, G.-P., Liu, Z.-X.

SPIE-The International Society for Optical Engineering

Ouandji, F., Potter, E., Chen, W.R., Liu, H.

SPIE-The International Society for Optical Engineering

Chen,W.R., Liu,H., Bartels,K.E., Nordquist,R.E.

SPIE-The International Society for Optical Engineering

Jiang,H., Liu,H., Chen,W.R., Fajardo,L.L.

SPIE - The International Society for Optical Engineering

Rao, Y., Jiang, X., Chen, X., Liu, R.

SPIE-The International Society for Optical Engineering

Aufrichtig,R., Su,Y., Cheng,Y., Granfors,P.R.

SPIE-The International Society for Optical Engineering

Chen, Y.-W., Han, X.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12