Blank Cover Image

Three-dimensional Bayesian optical diffusion tomography: source-detector calibration

著者名:
掲載資料名:
Optical biopsy IV : 21-23 January 2002, San Jose, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4613
発行年:
2002
開始ページ:
174
終了ページ:
182
総ページ数:
9
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819443526 [0819443522]
言語:
英語
請求記号:
P63600/4613
資料種別:
国際会議録

類似資料:

Milstein,A.B., Oh,S., Webb,K.J., Bouman,C.A., Millane,R.P.

SPIE-The International Society for Optical Engineering

G. Cao, C. A. Bouman, K. J. Webb

Society of Photo-optical Instrumentation Engineers

Millane, R.P., Milstein, A.M., Zhang, Q., Oh, S., Webb, K,J., Bouman, C.A., Boas, D.A.

SPIE-The International Society for Optical Engineering

Oh, S., Bouman, C. A., Webb, K. J.

SPIE - The International Society of Optical Engineering

Millane,R.P., Ye,J.C., Bouman,C.A., Webb,K.J.

SPIE-The International Society for Optical Engineering

Baskaran,S., Millane,R.P.

SPIE-The International Society for Optical Engineering

Ye,J.C., Bouman,C.A., Webb,K.J., Millane,R.P.

SPIE - The International Society for Optical Engineering

Bamford,K.J., James,S.W., Barr,H., Tatam,R.P.

SPIE - The International Society for Optical Engineering

Oh, S., Milstein, A.B., Bouman, C.A., Webb, K.J.

SPIE-The International Society for Optical Engineering

Korechoff,R.P., Kirby,D.M., Hochberg,E.B., Sepulveda,C.A., Jovanovic,V.M.

SPIE-The International Society for Optical Engineering

Ye,J.C., Webb,K.J., Downar,T.J., Millane,R.P.

SPIE-The International Society for Optical Engineering

Kumar, K., Oh, S., Condit, J. C., Grant, R. D., Kemp, N. J., Milner, T. E.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12