Clusters on semiconductor surfaces

Clusters on semiconductor surfaces

著者名:

Glembocki, O.J. ( Naval Research Lab. (USA) )
Prokes, S.M.
Kennedy, T.A.
Rajagopal, A.K.

掲載資料名:

Nanostructure Science, Metrology, and Technology

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4608

発行年:

2002

開始ページ:

151

終了ページ:

154

総ページ数:

4

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443472 [0819443476]

言語:

英語

請求記号:

P63600/4608

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012436
シリーズID:	PA00000029
会議名:	Nanostructure science, metrology, and technology
回次:	2001
会議開催地:	Gaithersburg, USA
会議開催年:	2001.09.05-2001.09.07

類似資料:

1 国際会議録 CHEMICALLY ASSISTED ION BEAM ETCHING OF SiGe Glembocki, O.J., Prokes, S.M., Stahlbush, R.E. Materials Research Society	7 国際会議録 INITIAL FORMATION OF SiGe/Si EPITAXIAL STRUCTURES AND OXIDES PRODUCED BY WET OXIDATION OF AMORPHOUS SiXGe1-XLAYERS Prokes, S.M., Rai, A.K. Materials Research Society
2 国際会議録 Photoreflectance Characterization and Control of Defects in GaN by Etching With an Inductively Coupled Plasma Glembocki, O.J., Gaskill, D.K., Prokes, S.M., Pearton, S.W. Materials Research Society	8 国際会議録 The role of surface adsorption in surface-enhanced Raman scattering from Benzene thiols D. A. Alexson, O. J. Glembocki, S. M. Prokes, R. W. Rendell, S. C. Badescu Society of Photo-optical Instrumentation Engineers
3 国際会議録 In Situ Studies of the Formation of Ga and Al Wires on Si(112) Facet Surfaces Prokes, S. M., Glembocki, O. J. MRS - Materials Research Society	9 国際会議録 THE MECHANISM OF EPITAXIAL Si-Ge/Si HETEROSTRUCTURS FORMATION BY WET OXIDATION OF AMORPHOUS Si-Ge THIN FILMS Prokes, S.M., Rai, A.K., Carlos, W.E. Materials Research Society
4 国際会議録 Observation of Free Carrier Redistribution Resulting from Stacking Fault Formation in Annealed 4H-SiC Glembocki, O.J., Skowronski, M., Prokes, S.M., Gaskill, D.K., Caldwell, J.D. Trans Tech Publications	10 国際会議録 Dielectric and geometric properties of plasmonics in metal/dielectric nanowires composites used in surface-enhanced Raman spectroscopy O. J. Glembocki, R. W. Rendell, S. M. Prokes, D. A. Alexson, M. A. Mastro Society of Photo-optical Instrumentation Engineers
5 国際会議録 Growth and characterization of single crystal semiconductor Ga2O3 nanowires and nanoribbons for sensing applications (Invited Paper) [6008-12] Prokes S. M., Carlos W. E., Glembocki O. J. SPIE - The International Society of Optical Engineering	11 国際会議録 Nanoshell, nanosphere, and nanowire geometries for hot spot formation in surface enchanced Ramon scattering [6008-09] Glembocki O. J., Prokes S. M., Szmacinski H., Liu J., Kub F., Kub C. SPIE - The International Society of Optical Engineering
6 国際会議録 AN ALTERNATE MECHANISM FOR POROUS Si PHOTOLUMINESCENCE: RECOMBINATION IN SiH COMPLEXES Prokes, S.M., Glembocki, O.J., Bermudez, V.M., Kaplan, R., Friedersdorf, L.E., Searson, P.C. Materials Research Society	12 国際会議録 Growth and characterization of single crystal InAs nanowire arrays and their application to plasmonics [6370-25] Prokes, S. M., Park, H. D., Glembocki, O. J. SPIE - The International Society of Optical Engineering

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