Temperature dependence of low-frequency electrical noise and reliability of semiconductor lasers

Temperature dependence of low-frequency electrical noise and reliability of semiconductor lasers

著者名:

Chen, X.Y. ( Univ. of Tromso (Norway) )
Johansen, J.A. ( Univ. of Tromaso (Norway) )
Liu, C.L. ( Xi'an Jiaotong Univ. (China) )

掲載資料名:

Semiconductor Optoelectronic Device Manufacturing and Applications

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4602

発行年:

2001

開始ページ:

128

終了ページ:

133

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443410 [0819443417]

言語:

英語

請求記号:

P63600/4602

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012430
シリーズID:	PA00000029
会議名:	Semiconductor optoelectronic device manufacturing and applications
回次:	2001
会議開催地:	Nanjing, China
会議開催年:	2001.11.07-2001.11.09

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