Blank Cover Image

ESD protection design for advanced CMOS (Invited Paper)

著者名:
掲載資料名:
Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4600
発行年:
2001
開始ページ:
123
終了ページ:
131
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443397 [0819443395]
言語:
英語
請求記号:
P63600/4600
資料種別:
国際会議録

類似資料:

J. J. Liou, J. A. Salcedo, Z. Liu

Electrochemical Society

Jomaah, J., Balestra, F.

SPIE-The International Society for Optical Engineering

Radhakrishnan, M.K., Vassilev, V., Keppens, B., De Heyn, V., Natarajan, M., Groeseneken, G.

SPIE-The International Society for Optical Engineering

Dunn, J., Joseph, A., Harame, D., Nowak, E.J., Meyerson, B.S.

Electrochemical Society

Ghibaudo, G.

SPIE-The International Society for Optical Engineering

Lyding, J. W., Lee, J., Cheng, K., Albrecht, P. M., Ruppalt, L. B., Hess, K.

Electrochemical Society

Franey, J. P., Freund, R. S., Sias, R., Beamer. B

Materials Research Society

Dittberner, G.J., Crison, M.J., Bajpai, S., Diedrich, B.L.

SPIE - The International Society of Optical Engineering

Han,J., Tang,J., Ji,L., Wang,G.

SPIE-The International Society for Optical Engineering

Shu, D., Maser, J., Halt, M., Lai, B., Vogt. S., Wang, Y., Preissner, C., Han, Y., B. Tieman,, Winarski, R., …

SPIE - The International Society of Optical Engineering

Camp, J.B., Billingsley, G., Kells, W.P., Lazzarini, A., Sanders, G.H., Whitcomb, S., Alexandrovski, A., Fejer, M.M., …

SPIE-The International Society for Optical Engineering

Li, X.J., Zhang, B.G., Yao, J.Q., Wang, P.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12