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Thin film characterization using terahertz differential time-domain spectroscopy and double modulation

著者名:
Mickan, S.P. ( Rensselaer Polytechnic Institute (USA) )
Lee, K.-S. ( Rensselaer Polytechnic Institute (USA) )
Lu, T.-M.
Barnat, E.
Munch, J. ( Adelaide Univ. (Australia) )
Abbott, D.
Zhang, X.-C. ( Rensselaer Polytechnic Institute (USA) )
さらに 2 件
掲載資料名:
Electronics and structures for MEMS II : 17-19 December 2001, Adelaide, Australia
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4591
発行年:
2001
開始ページ:
197
終了ページ:
209
総ページ数:
13
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443212 [0819443212]
言語:
英語
請求記号:
P63600/4591
資料種別:
国際会議録

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