Characterization of Ruthenia-Based Resistors Embedded in Low Temperature Co-fired Ceramic Substrates

Characterization of Ruthenia-Based Resistors Embedded in Low Temperature Co-fired Ceramic Substrates

著者名:

Fu, Shen-Li, ( I-Shou University )
His Chi-Shiung

掲載資料名:

Proceedings : International Symposium on Advanced Packaging Materials : processes, properties and interfaces, Chateau Elan, Braselton, Georgia, March 11-14, 2001

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4587

発行年:

2001

開始ページ:

190

終了ページ:

194

総ページ数:

5

出版情報:

Washington, DC: IMAPS

ISSN:

0277786X

ISBN:

9780930815646 [0930815645]

言語:

英語

請求記号:

P63600/4587

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012415
シリーズID:	PA00000029
会議名:	International Symposium on Advanced Packaging Materials
回次:	2001
会議開催地:	Braselton, Georgia, USA
会議開催年:	2001.03.11-2001.03.14

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