Alternating phase shifting mask implementation to 0.1-μm logic gates
- 著者名:
Chang,C.-H. ( Taiwan Semiconductor Manufacturing Co., Ltd. ) Tzu,S.-D. Hsieh,C.-H. Dai,C.M. Lin,B.J. Lin,C.-H. Liu,H.-Y. - 掲載資料名:
- 21st Annual BACUS Symposium on Photomask Technology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4562
- 発行年:
- 2001
- 巻:
- 4562
- パート:
- One of Two Parts
- 開始ページ:
- 368
- 終了ページ:
- 378
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442901 [0819442909]
- 言語:
- 英語
- 請求記号:
- P63600/4562
- 資料種別:
- 国際会議録
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6
国際会議録
0.13-ヲフm optical lithography for random logic devices using 248-nm attenuated phase-shifting masks
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