Method for testing electrostatic discharge tolerance for fingerprint sensor LSI
- 著者名:
Tanade,Y. ( NTT Telecommunications Energy Labs. ) Unno,H. Machida,K. Sato,N. Ishii,H. Shigematsu,S. Morimura,H. Kyuragi,H. - 掲載資料名:
- Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4558
- 発行年:
- 2001
- 開始ページ:
- 81
- 終了ページ:
- 88
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442864 [0819442860]
- 言語:
- 英語
- 請求記号:
- P63600/4558
- 資料種別:
- 国際会議録
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