Computer simulation of electric field analysis for vertically aligned carbon nanotubes: I. Simulation method and computing model

Computer simulation of electric field analysis for vertically aligned carbon nanotubes: I. Simulation method and computing model

著者名:

Murata,H. ( Meijo Univ. )
Shimoyama,H.
Ohye,T.

掲載資料名:

Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4510

発行年:

2001

開始ページ:

156

終了ページ:

162

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819442246 [0819442240]

言語:

英語

請求記号:

P63600/4510

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012224
シリーズID:	PA00000029
会議名:	Optics & Photonics : Charged particle detection, diagnostics, and imaging
回次:	2001
会議開催地:	San Diego, CA, USA
会議開催年:	2001.07.30-2001.08.02

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