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X-ray interferometry: ultra-high-resolution astronomy

著者名:
掲載資料名:
Soft X-ray and EUV imaging systems II : 31 July-1 August 2001, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4506
発行年:
2001
開始ページ:
127
終了ページ:
135
総ページ数:
9
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442208 [0819442208]
言語:
英語
請求記号:
P63600/4506
資料種別:
国際会議録

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