Beam diagnostics with correlation techniques at Spring-8

Beam diagnostics with correlation techniques at Spring-8

著者名:

Yabashi,M. ( Spring-8/JASRI )
Yamazaki,H.
Ishikawa,T.

掲載資料名:

Optics for fourth-generation x-ray sources : 1-2 August 2001, San Diego, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4500

発行年:

2001

開始ページ:

177

終了ページ:

186

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819442147 [0819442143]

言語:

英語

請求記号:

P63600/4500

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012214
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optics for fourth-generation x-ray sources
回次:	2001
会議開催地:	San Diego, CA, USA
会議開催年:	2001.08.01-2001.08.02

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