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Submicron elastic property characterization of materials using a near-field scanning optical microscope

著者名:
掲載資料名:
Controlling and using light in nanometric domains : 2-3 August 2001 San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4456
発行年:
2001
開始ページ:
97
終了ページ:
106
総ページ数:
10
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441706 [0819441708]
言語:
英語
請求記号:
P63600/4456
資料種別:
国際会議録

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