Blank Cover Image

Invariant pattern recognition with defocused images

著者名:
掲載資料名:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications : 3-7 September 2001 Tandil, Argentina
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4419
発行年:
2001
開始ページ:
608
終了ページ:
611
総ページ数:
4
出版情報:
Bellingham, WA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441263 [0819441260]
言語:
英語
請求記号:
P63600/4419
資料種別:
国際会議録

類似資料:

Vargas, A.A., Campos, J., San Martin, C., Vera, N.

SPIE - The International Society of Optical Engineering

Vargas,A., Campos,J., Navarro,R.B.

SPIE-The International Society for Optical Engineering

Yzuel,M.J., Campos,J., Navarro,R.B., Ahouzi,E., Moreno,I., Vargas,A., Lopez-Coronado,O.

SPIE - The International Society for Optical Engineering

Moreno,I.S., Kober,V., Lashin,V., Campos,J., Yaroslavsky,L.P., Yzuel,M.J.

SPIE-The International Society for Optical Engineering

Vargas,A., Campos,J., Navarro,R.

SPIE-The International Society for Optical Engineering

Kober,V., Lashin,V., Moreno,I., Yaroslavsky,L., Yzuel,M.J., Campos,J.

SPIE-The International Society for Optical Engineering

Vargas,A., Campos,J., Yzuel,M.J., Iemmi,C.C., Ledesma,S.A.

SPIE - The International Society for Optical Engineering

Styczynski,K., Chalasinska-Macukow,K., Koczyk,P., Campos,J., Yzuel,M.J.

SPIE-The International Society for Optical Engineering

Yzuel,M.J., Campos,J., Moreno,I.S., Ahouzi,E., Attaieb,A.

SPIE - The International Society for Optical Engineering

V. Kober, L.P. Yaroslavsky, J. Campos, M.J. Yzuel

Society of Photo-optical Instrumentation Engineers

Yzuel,M.J., Nicolas,J., Moreno,I., Campos,J.

SPIE-The International Society for Optical Engineering

Corbalan,M., Yzuel,M.J., Millan,M.S.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12