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Stress-induced effects in semiconducting epitaxial layers

著者名:
Bak-Misiuk,J. ( Institute of Physics )
Domagala,J.
Misiuk,A.
Kaniewski,J.
Adamczewska,J.
Trela,J.
Reginski,K.
Dobosz,D.
Prujszczyk,M.
Tedenac,J.C.
さらに 5 件
掲載資料名:
International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4413
発行年:
2000
開始ページ:
262
終了ページ:
266
総ページ数:
5
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441164 [0819441163]
言語:
英語
請求記号:
P63600/4413
資料種別:
国際会議録

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