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Deep-level defects in semi-insulating LT MBE GaAs

著者名:
掲載資料名:
International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4413
発行年:
2000
開始ページ:
203
終了ページ:
207
総ページ数:
5
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441164 [0819441163]
言語:
英語
請求記号:
P63600/4413
資料種別:
国際会議録

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