Effect of stress on defect transformation in hydrogen-implanted silicon and SOI structures
- 著者名:
Antonova,J.V. ( Institute of Semiconductor Physics ) Popov,V.P. Bak-Misiuk,J. Domagala,J. Misiuk,A. Obodnikov,V.I. Gutakovskii,A.K. Romano-Rodriguez,A. - 掲載資料名:
- International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4412
- 発行年:
- 2000
- 開始ページ:
- 120
- 終了ページ:
- 125
- 総ページ数:
- 6
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819441157 [0819441155]
- 言語:
- 英語
- 請求記号:
- P63600/4412
- 資料種別:
- 国際会議録
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