Integrated metrology: an enabler for advanced process control (APC)
- 著者名:
- Schneider,C. ( Fraunhofer Institute for Integrated Circuits )
- Pfitzner,L.
- Ryssel,H.
- 掲載資料名:
- In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4406
- 発行年:
- 2001
- 開始ページ:
- 118
- 終了ページ:
- 130
- 総ページ数:
- 13
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819441072 [0819441074]
- 言語:
- 英語
- 請求記号:
- P63600/4406
- 資料種別:
- 国際会議録
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10
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