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Fringe pattern compensation by synthesis of phase-shifted interferograms

著者名:
掲載資料名:
Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4398
発行年:
2001
開始ページ:
35
終了ページ:
44
総ページ数:
10
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440938 [0819440930]
言語:
英語
請求記号:
P63600/4398
資料種別:
国際会議録

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